Surface Roughness Instrument
SURFTEST SJ500/SV-2100
SURFTEST SJ-500P/SV-2100M4
High-accuracy, high-performance surface roughness instruments with a dedicated control unit that provides an easy-to-see display and simple operation.
Measuring range (X axis): 50 mm, 100 mm
Measuring range (Z1 axis): 800 μm /80 μm/8 μm
SPECIFICATIONS
Type of data processing | Dedicated data processor | PC system | |||||||
Model No. | SJ-500 | SV-2100M4 | SV-2100S4 | SV-2100H4 | SV-2100W4 | SJ-500P | SV-2100M4 | ||
Order No.* | with 0.75 mN detector |
mm | 178-532-01 | 178-636-01 | 178-680-01 | 178-682-01 | 178-684-01 | 178-534-11 | 178-638-11 |
inch /mm | 178-533-01 | 178-637-01 | 178-681-01 | 178-683-01 | 178-685-01 | 178-534-13 | 178-638-13 | ||
with 4 mN detector |
mm | 178-532-02 | 178-636-02 | 178-680-02 | 178-682-02 | 178-684-02 | — | — | |
inch /mm | 178-533-02 | 178-637-02 | 178-681-02 | 178-683-02 | 178-685-02 | — | — | ||
Measuring range |
X axis | 50 mm (2 in) |
100 mm (4 in) | 50 mm (2 in) |
100 mm (4 in) |
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Z axis (detector) | 800 μm, 80 μm, 8 μm (32000 μin, 3200 μin, 320 μin) | ||||||||
Detector | Detection method | Differential inductance | |||||||
Resolution | 0.01 μm (800 μm range), 0.001 μm (80 μm range), 0.0001 μm (8 μm range) (0.4 μin <32000 μin range>, 0.04 μin <3200 μin range>, 0.004 μin <320 μin range>) |
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Stylus tip shape (Angle / Radius) Measuring force | 60°/ 2 μm, 0.75 mN 90°/ 5 μm, 4 mN |
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Drive unit (X axis) |
Measuring speed | 0.02 - 5 mm/s | |||||||
Drive speed | 0 - 20 mm/s or manual |
0 - 40 mm/s or manual | 0 - 20 mm/s or manual | 0 - 40 mm/s or manual | |||||
Straightness | 0.2 μm/ 50 mm*¹ | 0.15 μm/100 mm | 0.2 μm/ 50 mm*¹ | 0.15 μm/100 mm | |||||
Resolution | 0.05 μm (1.97 μin) | ||||||||
Drive unit (Z2 axis) |
Travel | — | 350 mm (H4, W4: 550 mm) | — | 350 mm | ||||
Drive speed | —*² | Manual | 0 - 20 mm/s or manual | —*² | Manual | ||||
Resolution | — | 1 μm (39.4 μin) | — | ||||||
Applicable standards | JIS1982 / JIS1994 / JIS2001/ ISO1997/ANSI / VDA | ||||||||
Parameter | Pa, Pq, Pz, Pp, Pv, Pt, Psk, Pku, Pc, PSm, PΔq, Pmr, Pmr(c), Pδc, Rk, Rpk, Rvk, Mr1, Mr2, A1, A2, Rmax, Rz, Pmax, PzJIS Ra, Rq, Rz, Rp, Rv, Rt, Rsk, Rku, Rc, RSm, RΔq, Rmr, Rmr(c), Rδc, Ry, R3z, RPc, Pc, Sm, S, HSC, Rmax, RzJIS, Rppi, RΔa, Rλa, Rλq, Rlo, Rlr, tp, Htp, Vo Wa, Wq, Wz, Wp, Wv, Wt, Wsk, Wku, Wc, WSm, WΔq, Wmr, Wmr(c), Wδc, Wy, W3z, WPc, Wmax, WΔa, Wλa, Wλq, Wlo, Wlr R, Rx, AR, W, Wx, AW, Wte |
Pa, Pq, Psk, Pku, Pp, Pv, Pz, Pt, Pc, PSm, PΔq, Pmr(c), Pmr, Pδc, Ppq, Pvq, Pmq, PPc, PzJIS, PPI, Ra, Rq, Rsk, Rku, Rp, Rv, Rz, Rt, Rc, RSm, RΔq, Rmr(c), Rmr, Rδc, Rpq, Rvq, Rmq, Rmax, RzJIS, Wa, Wq, Wsk, Wku, Wp, Wv, Wz, Wt, Wc, WSm, WΔq, Wmr(c), Wmr, Wδc, Wst, Rk, Rpk, Rvk, Mr1, Mr2, A1, A2, Rx, AR, R, Wx, AW, W, Wte, Ry, RyDIN, RzDIN, R3y, R3z, S, HSC, Lo, lr, Δa, λa, λq, Vo, Htp, NR, NCRX, CPM, SR, SAR, NW, SW, SAW |
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Filtered profile | Primary profile, Roughness profile, Waviness profile, DF profile, Roughness motif profile, Waviness motif profile |
Primary profile, Roughness profile, Waviness profile, Filtered waviness profile, Band waviness profile, Rolling circle waviness profile, Rolling circle center line waviness profile, envelope residual profile, DIN4776 profile, Roughness motif profile, Waviness motif profile |
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Analysis grap | ADC, BAC, power spectrum graph | ADC, BAC Graph, power spectrum graph, auto-correlation graph, Walsh power spectrum graph, Walsh auto-correlation graph, local peak distribution graph, slope distribution graph, parameter distribution graph |
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Data compensation functions | Inclination (Entire, Arbitrary), Circular compensation, Elliptical compensation, Parabolic compensation, Hyperbolic compensation, Conic compensation, Stylus circular-arc compensation |
Inclination (Entire / start /end /Arbitrary), R-surface correction, Elliptical compensation, Parabolic compensation, Hyperbolic compensation, Conic compensation, Polynomial correction |
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Filter | Gaussian, 2CR75, PC75, Robust-Spline | Gaussian, 2CR75, 2CR50, 2CRPC75, 2CRPC50, Robust-Spline, Robust-Gaussian | |||||||
Cutoff value | λs: 0.25 /0.8/2.5 /8/25 /80 /250 μm/None λc: 0.025 / 0.08 / 0.25 / 0.8 / 2.5 / 8 / 25 / 80 mm*3 λf: 0.08 / 0.25 / 0.8 / 2.5 / 8 / 25 / 80 mm/ None |
λs: 0.8/2.5 /8/25 /80 /250 /800 μm/Arbitrary λc: 0.025 / 0.08 / 0.25 / 0.8 / 2.5 / 8 / 25 / 80mm/Arbitrary λf: 0.08/0.25 /0.8/2.5 /8.0 /25 /80 /250mm/Arbitrary |
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Sampling length | 0.025 / 0.08 / 0.25 / 0.8 / 2.5 / 8 / 25 / 80 mm*3 | 0.025 / 0.08 / 0.25 / 0.8 / 2.5 / 8 / 25mm/Arbitrary | |||||||
Number of intervals | 1 - 20 | - 700 (max.) | |||||||
Arbitrary length | 0.02 - 50 mm (0.01 mm interval) |
0.02 - 100 mm (0.01 mm interval) |
0.025 - 50 mm (0.001 mm interval) |
0.025 - 100 mm (0.001 mm interval) |
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Display language | 16 languages (Japanese, English, German, French, Italian, Spanish, Portuguese, Korean, Chinese (traditional / simplified), Czech, Polish, Hungarian,Turkish, Swedish, Dutch) |
18 languages (Japanese, English, German, French, Italian, Spanish, Portuguese, Korean, Chinese (traditional / simplified), Czech, Polish, Hungarian,Turkish, Swedish, Dutch, Russian, Thai) |
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External dimensions (W×D×H) |
Main unit | 425×94×160 mm | 716×450×863 mm | S4: 766×450×966 mm H4: 766×450×1166 mm W4: 1166×450×1176 mm |
425×94×160 mm | 716×450×863 mm | |||
Display unit | 330×270×124 mm | —*⁴ | —*⁴ | ||||||
Electronic unit | — | 372×245×71.8 mm | — | — | |||||
PC I / F unit | — | 350×263×86 mm | |||||||
Mass | Main unit | 2.7 kg | 140 kg | S4: 140 kg H4: 150 kg W4: 220 kg |
2.7 kg | 140 kg | |||
Display unit | 4.0 kg | —*⁴ | —*⁴ | ||||||
Electronic unit | — | 3.0 kg | — | — | |||||
PC I / F unit | — | 3.8 kg |
*1 When using the simplified stand (optional): 0.4 μm /50 mm
When using the manual column stand (optional): 0.3 μm /50 mm
*2 The simplified stand or manual column stand is available as an optional accessory. (Refer to page 11 for details.)
*3 80 mm only for the SV-2100 Series.
*4 Varies depending on the PC system.
แบรนด์สินค้า | MITUTOYO |
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