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SURFTEST SJ500/SV-2100 - Surface Roughness Instrument | MITUTOYO

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SJ500/SV2100

Surface Roughness Instrument


SURFTEST SJ500/SV-2100
SURFTEST SJ-500P/SV-2100M4



High-accuracy, high-performance surface roughness instruments with a dedicated control unit that provides an easy-to-see display and simple operation.
Measuring range (X axis): 50 mm, 100 mm
Measuring range (Z1 axis): 800 μm /80 μm/8 μm

SURFTEST SJ500/SV-2100 - Surface Roughness Instrument | MITUTOYO
SURFTEST SJ500/SV-2100 - Surface Roughness Instrument | MITUTOYO

SPECIFICATIONS

Type of data processing Dedicated data processor PC system
Model No. SJ-500 SV-2100M4 SV-2100S4 SV-2100H4 SV-2100W4 SJ-500P SV-2100M4
Order No.* with 0.75 mN
detector
mm 178-532-01 178-636-01 178-680-01 178-682-01 178-684-01 178-534-11 178-638-11
inch /mm 178-533-01 178-637-01 178-681-01 178-683-01 178-685-01 178-534-13 178-638-13
with 4 mN
detector
mm 178-532-02 178-636-02 178-680-02 178-682-02 178-684-02
inch /mm 178-533-02 178-637-02 178-681-02 178-683-02 178-685-02
Measuring
range
X axis 50 mm
(2 in)
100 mm (4 in) 50 mm
(2 in)
100 mm
(4 in)
Z axis (detector) 800 μm, 80 μm, 8 μm (32000 μin, 3200 μin, 320 μin)
Detector Detection method Differential inductance
Resolution 0.01 μm (800 μm range), 0.001 μm (80 μm range), 0.0001 μm (8 μm range)
(0.4 μin <32000 μin range>, 0.04 μin <3200 μin range>, 0.004 μin <320 μin range>)
Stylus tip shape (Angle / Radius) Measuring force 60°/ 2 μm, 0.75 mN
90°/ 5 μm, 4 mN
Drive unit
(X axis)
Measuring speed 0.02 - 5 mm/s
Drive speed 0 - 20 mm/s
or manual
0 - 40 mm/s or manual 0 - 20 mm/s or manual 0 - 40 mm/s or manual
Straightness 0.2 μm/ 50 mm*¹ 0.15 μm/100 mm 0.2 μm/ 50 mm*¹ 0.15 μm/100 mm
Resolution 0.05 μm (1.97 μin)
Drive unit
(Z2 axis)
Travel 350 mm (H4, W4: 550 mm) 350 mm
Drive speed —*² Manual 0 - 20 mm/s or manual —*² Manual
Resolution 1 μm (39.4 μin)
Applicable standards JIS1982 / JIS1994 / JIS2001/ ISO1997/ANSI / VDA
Parameter Pa, Pq, Pz, Pp, Pv, Pt, Psk, Pku, Pc, PSm, PΔq, Pmr, Pmr(c), Pδc, Rk, Rpk, Rvk, Mr1, Mr2, A1, A2, Rmax, Rz, Pmax, PzJIS
Ra, Rq, Rz, Rp, Rv, Rt, Rsk, Rku, Rc, RSm, RΔq, Rmr, Rmr(c), Rδc, Ry, R3z, RPc, Pc, Sm, S, HSC, Rmax, RzJIS, Rppi, RΔa, Rλa, Rλq, Rlo, Rlr, tp, Htp, Vo Wa, Wq, Wz, Wp, Wv, Wt, Wsk, Wku, Wc, WSm, WΔq, Wmr, Wmr(c), Wδc, Wy, W3z, WPc, Wmax, WΔa, Wλa, Wλq, Wlo, Wlr R, Rx, AR, W, Wx, AW, Wte
Pa, Pq, Psk, Pku, Pp, Pv, Pz, Pt, Pc, PSm, PΔq, Pmr(c), Pmr, Pδc, Ppq, Pvq, Pmq, PPc, PzJIS, PPI, Ra, Rq, Rsk, Rku, Rp, Rv, Rz, Rt, Rc, RSm, RΔq, Rmr(c), Rmr, Rδc, Rpq, Rvq, Rmq, Rmax, RzJIS, Wa, Wq, Wsk, Wku, Wp, Wv, Wz, Wt, Wc, WSm, WΔq, Wmr(c), Wmr, Wδc, Wst, Rk, Rpk, Rvk, Mr1, Mr2, A1, A2, Rx, AR, R, Wx, AW, W,
Wte, Ry, RyDIN, RzDIN, R3y, R3z, S, HSC, Lo, lr, Δa, λa, λq, Vo, Htp, NR, NCRX, CPM, SR, SAR, NW, SW, SAW
Filtered profile Primary profile, Roughness profile, Waviness profile, DF profile,
Roughness motif profile, Waviness motif profile
Primary profile, Roughness profile, Waviness profile, Filtered
waviness profile, Band waviness profile, Rolling circle waviness profile, Rolling circle center line waviness profile, envelope residual profile, DIN4776 profile, Roughness motif profile,
Waviness motif profile
Analysis grap ADC, BAC, power spectrum graph ADC, BAC Graph, power spectrum graph, auto-correlation graph, Walsh power spectrum graph, Walsh auto-correlation
graph, local peak distribution graph, slope distribution graph,
parameter distribution graph
Data compensation functions Inclination (Entire, Arbitrary), Circular compensation, Elliptical compensation,
Parabolic compensation, Hyperbolic compensation, Conic compensation,
Stylus circular-arc compensation
Inclination (Entire / start /end /Arbitrary), R-surface correction,
Elliptical compensation, Parabolic compensation, Hyperbolic compensation, Conic compensation, Polynomial correction
Filter Gaussian, 2CR75, PC75, Robust-Spline Gaussian, 2CR75, 2CR50, 2CRPC75, 2CRPC50, Robust-Spline, Robust-Gaussian
Cutoff value λs: 0.25 /0.8/2.5 /8/25 /80 /250 μm/None
λc: 0.025 / 0.08 / 0.25 / 0.8 / 2.5 / 8 / 25 / 80 mm*3
λf: 0.08 / 0.25 / 0.8 / 2.5 / 8 / 25 / 80 mm/ None
λs: 0.8/2.5 /8/25 /80 /250 /800 μm/Arbitrary
λc: 0.025 / 0.08 / 0.25 / 0.8 / 2.5 / 8 / 25 / 80mm/Arbitrary
λf: 0.08/0.25 /0.8/2.5 /8.0 /25 /80 /250mm/Arbitrary
Sampling length 0.025 / 0.08 / 0.25 / 0.8 / 2.5 / 8 / 25 / 80 mm*3 0.025 / 0.08 / 0.25 / 0.8 / 2.5 / 8 / 25mm/Arbitrary
Number of intervals 1 - 20 - 700 (max.)
Arbitrary length 0.02 - 50 mm
(0.01 mm interval)
0.02 - 100 mm
(0.01 mm interval)
0.025 - 50 mm
(0.001 mm interval)
0.025 - 100 mm
(0.001 mm interval)
Display language 16 languages (Japanese, English, German, French, Italian, Spanish, Portuguese, Korean,
Chinese (traditional / simplified), Czech, Polish, Hungarian,Turkish, Swedish, Dutch)
18 languages (Japanese, English, German, French, Italian,
Spanish, Portuguese, Korean, Chinese (traditional / simplified),
Czech, Polish, Hungarian,Turkish, Swedish, Dutch, Russian, Thai)
External
dimensions
(W×D×H)
Main unit 425×94×160 mm 716×450×863 mm S4: 766×450×966 mm
H4: 766×450×1166 mm
W4: 1166×450×1176 mm
425×94×160 mm 716×450×863 mm
Display unit 330×270×124 mm —*⁴ —*⁴
Electronic unit 372×245×71.8 mm
PC I / F unit 350×263×86 mm
Mass Main unit 2.7 kg 140 kg S4: 140 kg
H4: 150 kg
W4: 220 kg
2.7 kg 140 kg
Display unit 4.0 kg —*⁴ —*⁴
Electronic unit 3.0 kg
PC I / F unit 3.8 kg

*1 When using the simplified stand (optional): 0.4 μm /50 mm
    When using the manual column stand (optional): 0.3 μm /50 mm
*2 The simplified stand or manual column stand is available as an optional accessory. (Refer to page 11 for details.)
*3 80 mm only for the SV-2100 Series.
*4 Varies depending on the PC system.

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